655件中(651 - 655)

[P-14-15L] Time Dependent Dielectric Breakdown and Time to Failure Analysis of 4H-SiC Power MOSFET

S. Bose¹ (1.Univ. of Illinois at Chicago , USA)

2010 International Conference on Solid State Devices and Materials |PDF ダウンロード

[PL-1-1] Nanotechnology for Sustainable Society

M. Nakamura¹ (1.Hitachi Ltd. , Japan)

2010 International Conference on Solid State Devices and Materials |PDF ダウンロード

[PL-1-2] More Moore and More Than Moore meeting for 3D in the 21st century

S. Deleonibus¹ (1.CEA-LETI , France)

2010 International Conference on Solid State Devices and Materials |PDF ダウンロード

[PL-2-1] 50 Years of the Laser

K. Shimoda¹ (1.Univ. of Tokyo , Japan)

2010 International Conference on Solid State Devices and Materials |PDF ダウンロード

[PL-2-2] In Half aCentury of Research Career, What did I Explore?

L. Esaki¹ (1.Yokohama College of Pharmacy /The Science and Technology Promotion Foundation of Ibaraki , Japan)

2010 International Conference on Solid State Devices and Materials |PDF ダウンロード

655件中(651 - 655)