[G-3-2] Analysis of Within-Die and Die-to-Die CMOS-Process Variation With Reconfigurable Ring-Oscillator Arrays
2010 International Conference on Solid State Devices and Materials |PDF ダウンロード
655件中(241 - 250)
[G-3-3] Large Scale Test Circuits for Systematic Evaluation of Variability and Noise of MOSFETs' Electrical Characteristics
2010 International Conference on Solid State Devices and Materials |PDF ダウンロード
[G-3-4] A 65nm CMOS 400ns Measurement Delay NBTI-Recovery Sensor by Minimum Assist Circuit
2010 International Conference on Solid State Devices and Materials |PDF ダウンロード
[G-3-5] Prediction of Circuit Degradation with Transient BTI and HC Simulations
2010 International Conference on Solid State Devices and Materials |PDF ダウンロード
[G-4-1] A Gate-drain Coupling Distributed Amplifier in 90-nm CMOS Technology
2010 International Conference on Solid State Devices and Materials |PDF ダウンロード
[G-4-2] A 60dB SFDR Low-Noise Amplifier with Variable Bandwidth for Neural Recoding Systems
2010 International Conference on Solid State Devices and Materials |PDF ダウンロード
[G-4-3] Temperature Compensated Nano-Ampere CMOS Current Reference Circuit Using Small Offset Voltage
2010 International Conference on Solid State Devices and Materials |PDF ダウンロード
[G-4-4L] Low-voltage Power Supply Regulator for Subthreshold-operated CMOS Digital LSIs
2010 International Conference on Solid State Devices and Materials |PDF ダウンロード
[G-5-1] Integrated CMOS-MEMS Technology and its Application.
2010 International Conference on Solid State Devices and Materials |PDF ダウンロード
[G-5-2] Polarization Analyzing Image Sensor with Monolithically Embedded Polarizer using 65nm CMOS Process
2010 International Conference on Solid State Devices and Materials |PDF ダウンロード